Oxford Instruments (LON:OXIG) had its price objective raised by analysts at JPMorgan Chase & Co. from GBX 1,180 ($15.42) to GBX 1,462 ($19.10) in a note issued to investors on Wednesday, ThisIsMoney.Co.Uk reports. The brokerage presently has an “overweight” rating on the stock. JPMorgan Chase & Co.‘s price target suggests a potential downside of 5.80% from the stock’s previous close.
Several other brokerages have also recently weighed in on OXIG. Peel Hunt reaffirmed a “buy” rating and set a GBX 1,450 ($18.95) target price on shares of Oxford Instruments in a research note on Tuesday. Shore Capital reiterated a “buy” rating on shares of Oxford Instruments in a research report on Tuesday. Finally, Peel Hunt reiterated a “buy” rating and issued a GBX 1,450 ($18.95) price target on shares of Oxford Instruments in a research report on Tuesday. Six investment analysts have rated the stock with a buy rating, The stock has a consensus rating of “Buy” and an average target price of GBX 1,372.40 ($17.93).
OXIG stock traded down GBX 40 ($0.52) during trading hours on Wednesday, hitting GBX 1,552 ($20.28). 58,539 shares of the stock traded hands, compared to its average volume of 49,802. The stock has a 50-day simple moving average of GBX 1,313.68 and a 200 day simple moving average of GBX 1,260.94. Oxford Instruments has a one year low of GBX 813 ($10.62) and a one year high of GBX 1,468 ($19.18). The company has a market cap of $890.51 million and a P/E ratio of 29.85. The company has a current ratio of 1.33, a quick ratio of 0.84 and a debt-to-equity ratio of 18.55.
Oxford Instruments Company Profile
Oxford Instruments plc, through its subsidiaries, researches, develops, manufactures, rents, sells, and services tools and systems in the United States, rest of Europe, rest of Asia, the United Kingdom, Japan, China, Germany, and internationally. The company's Nanotechnology Tools segment provides high performance scientific imaging cameras, spectroscopy solutions, and microscopy systems for research and OEM markets; atomic force probe microscopy for materials and bioscience applications; 3D and 4D image visualization and analysis software; and nanoanalysis solutions for materials characterization and nanofabrication on scanning electron microscopes, focussed ion beams, and transmission electron microscopes.
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